Influence of spurious resonances on the interaction force in dynamic AFM

• Luca Costa and
• Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

• ; amplitude modulation; atomic force microscopy; fluid borne excitation; interferometric detection; laser-beam detection; spurious resonances; Introduction Dynamic atomic force microscopy (AFM) was introduced in the late 1980s [1] as the natural evolution of the first atomic force microscopes [2]. Thanks to

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

• Christian Obermair,
• Marina Kress,
• Andreas Wagner and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 824–830, doi:10.3762/bjnano.3.92

• measured both before and after each experiment. Schematic diagram of an electrochemical atomic force microscope, comprising an atomic force microscope with a laser-beam detection system (not shown), an electrochemical liquid cell with reference electrode (RE), counter electrode (CE) and working electrode